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HIOKI 9666 Test Probe (100:1) for Memory HiCorders
HIOKI 9666 Test Probe (100:1) for Memory HiCorders Hioki Selangor, Penang, Malaysia, Kuala Lumpur (KL), Petaling Jaya (PJ), Butterworth Supplier, Suppliers, Supply, Supplies | MOBICON-REMOTE ELECTRONIC SDN BHD
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Product Details

Test Probe (100:1) for Memory HiCorders

  • 9666 Test Probe (100:1)
  • For Hioki Memory HiCorders with BNC inputs.
  • Input capacitance to the probe can be lowered to reduce the load effect

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