KEYSIGHT E9902E 2-Module In-Circuit Test (ICT) System, i307x Series 5
KEYSIGHT E9902E 2-Module In-Circuit Test (ICT) System, i307x Series 5 In-circuit Test Keysight Selangor, Penang, Malaysia, Kuala Lumpur (KL), Petaling Jaya (PJ), Butterworth Supplier, Suppliers, Supply, Supplies | MOBICON-REMOTE ELECTRONIC SDN BHD
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Product Details

The E9902E offers max 2592 nodes testing plus the new Series 5 infrastructure for flexible external electronics connection and higher analog testing throughput


  • Max node count : 2592
  • Max channel count : 576
  • Footprint : 1.8 m x 0.8 m / 5.8’ x 2.6’
  • Max no of modules : 2

The E9902E i317x Series 5 system offers is designed to meet the needs of most mainstream electronics manufacturers seeking not only in-circuit test capability but additional test capability to ensure the highest test coverage for PCBAs. A two module option of the i3070 ideal for customers who require less node count capability.

All i3070 Series 5 tests systems include a new infrastructure for more flexibility in the addition, control and connection of external electronics or instruments. The system allows external electronics to be plugged into the testhead as if it has been merged into the system. The external electronics can be functional test circuits to provide additional functional test coverage at ICT, or provide additional stimulus to the unit under test for better test coverage. Control of the external electronics, test sequence and test results are still through the BT-BASIC testplan, executed by the testhead PC Controller that our users are familiar with.

PCBAs today have higher current requirements in order to power their increased functionalities. It is now possible to pump 10 A into the unit under test through the tester. The power supply port can also be multiplexed so that one power supply can power up to 6 different boards in a panel. Each power channel is controlled by a relay so that the unit under test is protected.

The i3070 Series 5 test system includes a new Analog Stimulus and Measurement Unit (ASRU) that can boost the analog test speeds by 20%, thus increasing the throughput of the units under test.

The limited test access test tools found in previous revision of the test system is available here.

If you have large boards that you want to test quicker with better test coverage, the E9903E i307x Series 5 system is for you.

Read more about the i3070 Series 5 here.

All Medalist i3070 test systems are able to accept both Mux pin cards as well as UnMux pin cards. This is to provide you more flexibility in the use of this system.

Features Analog Plus
(Mux)
Access Plus
(Mux)
Hybrid Plus
(Mux)
Hybrid 144
(Unmux)
Test nodes per card 144 8 x High Frequency10:28 instrument ports24 x GP Relays  144 144
Digital channels per card N/A  N/A  16 144
Max pattern rate/frequency N/A  HF: 100MHz
Inst Ports: 25MHz
GP Relays: N/A
6/12/20 MPS 6 MPS
Maximum cards per module/system**  9/18 9/18 9/18 9/18
Analog voltage range 0-100V 0-100V 0-100V 0-100V
Digital Drive/Receive range N/A  N/A  -3.5 to 5.0V  0 to 4.75V
Edge Placement Accuracy N/A N/A +/- 10 nS +/- 10 nS

** Total pin cards cannot exceed 9 pin cards/module

To learn more, request additional product information.

For more information about ict systems, please visit ICT System - i3070.

Please leave your enquiry here, we will reply as soon as possible.


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