KEYSIGHT NX5402A Silicon Photonics Wafer Test System
KEYSIGHT NX5402A Silicon Photonics Wafer Test System Application-Specific Test Systems And Components Keysight Selangor, Penang, Malaysia, Kuala Lumpur (KL), Petaling Jaya (PJ), Butterworth Supplier, Suppliers, Supply, Supplies | MOBICON-REMOTE ELECTRONIC SDN BHD
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NX5402A Silicon Photonics Wafer Test System is a solution of Keysight NX5400 Silicon Photonics Test Solution Series. It provides all required features for volume production testing such as Wafer Acceptance Testing (WAT) or Process Control Monitoring (PCM) with a fully automated wafer prober for volume production.

  • One-stop integrated solution with optical/electrical test capabilities for fully-automated wafer prober
  • Automated one pass testing for complex and massive optical and electrical measurements
  • Volume production-ready with SECS/GEM Factory Automation, safety interlock, and clean room-ready features
  • High throughput testing by optimized fiber alignment and multi-channel optical/electrical test architecture
  • Guaranteed system performance by Keysight's Advanced Wafer-Level Photonic Calibration
  • Dedicated support model enabling high system availability for production
  • Keysight-developed Fiber Alignment and Positioning System
  • Leading-edge PathWave Semiconductor Test software integrating Keysight SPECS
  • Reliable performance monitoring by Build-in Automatic System Diagnostics
  • Automated Multi-Recipe Execution software enabling multiple recipes to run in batch mode

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